A. R. Schaefer - Concepedia

Author

A. R. Schaefer

National Institute of Standards and Technology ORCID

Also Known As

A R Schaefer, A. R. Schaefer, A. Russell Schaefer, A. Schaefer, A.R. SCHAEFER, A.R. Schaefer, Allison Schaefer, Arthur Schaefer, Cristina Gellini

Publications

498

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology United States Department of Commerce Universidade Federal do Rio de Janeiro Universidade de São Paulo

About

A. R. Schaefer is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	329
2	Applied Physics	7	7	315
3	Education	2	2	25
4	Health Sciences	2	2	25
5	Natural Sciences	2	2	26

A. R. Schaefer

Publications

416

Citations

H-Index

Page 1

	Year	Citations
Spectral response self-calibration and interpolation of silicon photodiodes Jon Geist, Edward F. Zalewski, A. R. Schaefer Applied Optics EngineeringElectrical Substitution RadiometerSilicon PhotodiodesImage SensorSpectral Response Self-calibration	1980	132
Silicon detector nonlinearity and related effects A. R. Schaefer, Edward F. Zalewski, Jon Geist Applied Optics Optical MaterialsEngineeringNonlinear OpticsSilicon On InsulatorSpatial Nonuniformity	1983	79
Complete collection of minority carriers from the inversion layer in induced junction diodes Jon Geist, Eli Liang, A. R. Schaefer Journal of Applied Physics Oxide-passivated Silicon PhotodiodesElectrical EngineeringInternal Quantum EfficiencyEngineeringPhotoluminescence	1981	48
An accurate value for the absorption coefficient of silicon at 633 nm Jon Geist, A. R. Schaefer, Junfeng Song, Journal of Research of the National Institute of Standards and Technology	1990	25
Wavefront analysis and modulation transfer function of three multifocal intraocular lenses MarconyR Santhiago, MarceloV Netto, Jackson Barreto, Indian Journal of Ophthalmology	2010	24
Direct Determination of the Stored Electron Beam Current at the NBS Electron Storage Ring, SURF-II A. R. Schaefer, L. R. Hughey, Joe Fowler Metrologia Absolute BeamEngineeringPhysicsDirect DeterminationElectron Counting	1984	20
Reduced absolute uncertainty in the irradiance of SURF-II and instrumentation for measuring linearity of X-ray, XUV and UV detectors L. R. Hughey, A. R. Schaefer Nuclear Instruments and Methods in Physics Research X-ray SpectroscopyRadiation DetectionHealth SciencesMeasurementCalibration	1982	15
Spectrophotometric tests using a dye-laser-based radiometric characterization facility A. R. Schaefer, K. L. Eckerle Applied Optics EngineeringSpectrophotometric TestsOptical TestingAbsorption SpectroscopyOptical Detectors	1984	14
Spatial uniformity of quantum efficiency of a silicon photovoltaic detector A. R. Schaefer, Jon Geist Applied Optics EngineeringOptical TestingQuantum SensingPhotovoltaicsQuantum Computing	1979	14
A Contralateral Eye Study Comparing Apodized Diffrative and Full Diffrative Lenses: Wavefront Analysis and Distance and Near Uncorrected Visual Acuity Marcony R. Santhiago, Marcelo V. Netto, Jackson Barreto, Clinics	2009	13

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