An accurate value for the absorption coefficient of silicon at 633 nm

Abstract

High-accuracy transmission measurements at an optical wavelength of 633 nm and mechanical measurements of the thickness of a 13-<i>µ</i>m thick silicon-crystal film have been used to calculate the absorption and extinction coefficients of silicon at 633 nm. The results are 3105±62 cm^-1 and 0.01564±0.00031, respectively. These results are about 15% less than current handbook data for the same quantities, but are in good agreement with a recent fit to one set of data described in the literature.