Polarization Sensitivity

Polarization Sensitivity is a metric in gamma-ray polarimetry that quantifies the minimum detectable polarization degree of a source, distinguishing it from other observational metrics by characterizing the instrumental capability to discriminate polarized emission from unpolarized background radiation.

629

Publications

34.6K

Citations

3.3K

Authors

834

Institutions

Publications per year

2017–2026

199

Authors

3.3K

  1. JL
    Jingbo Li

    Institute of Semiconductors, China

    12 publications · 1.1K citations

    12

    h-index

  2. ZW
    Zhongming Wei

    Institute of Semiconductors, China

    9 publications · 1K citations

    9

    h-index

  3. XX
    Xiaoxiong Xiong

    Goddard Space Flight Center, United States

    8 publications · 381 citations

    8

    h-index

  4. XL
    Xitao Liu

    Chinese Academy of Sciences, China

    8 publications · 551 citations

    8

    h-index

  5. NH
    Nengjie Huo

    South China Normal University, China

    8 publications · 433 citations

    8

    h-index

1–5 of 3.3K

Venues

  1. Applied Physics Letters

    35 publications · 1.3K citations

    24

    h-index

  2. IEEE Photonics Technology Letters

    IPTEL · 37 publications · 1.3K citations

    21

    h-index

  3. Optics Express

    35 publications · 1.4K citations

    21

    h-index

  4. Applied Optics

    25 publications · 1.1K citations

    18

    h-index

  5. Optics Letters

    24 publications · 897 citations

    17

    h-index

1–5