Journal of Applied Physics · 1974 · 26 citations · 13 references
EngineeringMaterials SciencePhysicsElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsIii-v SemiconductorsMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesThermal Properties Of SemiconductorsContact FormationCoolingInorganic SemiconductorsInterface FormationLiquid Phase EpitaxyOhmic ConductionOhmic ContactsOhmic Materials
The temperature range of Ohmic contact formation to ZnSe, ZnS0.5 Se0.5, and ZnS is presented. New experiments show contacts are formed by cooldown rather than by heatup and that contacts can be formed and removed reversibly by cyclic cooling and heating. This and other evidence suggest contact formation by liquid-phase epitaxy, as had been shown in group-IV and -III-V semiconductors, rather than diffusion. The role of wetting, which is necessary but not equivalent to contact formation, is discussed.
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Carrier Mobility and Shallow Impurity States in ZnSe and ZnTe
M. Aven, B. Segall · Physical Review · 1963 · 222 citations