Physical Review Letters · 1987 · 90 citations · 11 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureSurface ChemistrySurface ScienceScanning Probe MicroscopySemiconductor SurfacesSilicon MaterialsSurface CrystallographySurface MicroscopySurface PhysicsPeriodicityScanning Tunneling SpectroscopySilicon PhysicsSilicon Surface ReconstructionSilicon Surface ScienceStep EdgesStep MorphologySurface Steps
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21\ifmmode\bar\else\textasciimacron\fi{}1\ifmmode\bar\else\textasciimacron\fi{}] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A \ensuremath{\pi}-bonded reconstruction of the step edge is deduced from the images.
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Atom-selective imaging of the GaAs(110) surface
R. M. Feenstra, Joseph A. Stroscio, J. Tersoff et al. · Physical Review Letters · 1987 · 613 citations
The roughness of cleaved semiconductor surfaces
M. Henzler · Surface Science · 1973 · 158 citations