Surface Science · 1973 · 158 citations · 13 references
EngineeringMaterials EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsSurface ScienceSemiconductor InterfacesSemiconductor SurfacesSemiconductor Thin FilmsSurface MetrologySurface PhysicsSurface RoughnessSurface Roughness AnalysisSurface Roughness MeasurementThin Film Surface Roughness
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P. J. Boddy · Surface Science · 1966 · 800 citations
LEED-investigation of step arrays on cleaved germanium (111) surfaces
M. Henzler · Surface Science · 1970 · 264 citations
Surface studies by electron diffraction
P. J. Estrup, E.G. McRae · Surface Science · 1971 · 239 citations