Relationship between Raman Spectra and Crystallinity of CdS Films Grown by Cathodic Electrodeposition

Abstract

CdS films were cathodically electrodeposited from acidic solutions (pH=2.5) containing CdSO 4 and Na 2 S 2 O 3 . Raman scattering of these films was measured using the 514.5 nm line of an Ar ion laser as the light source. The longitudinal-optical (LO) phonon peak of CdS was observed between 300–310 cm -1 . The full width at half-maximum (FWHM) of the peak was a large value of 18.2 cm -1 for as-deposited films, but decreased to 12.7 cm -1 after the films were annealed at 500° C. These results are consistent with those of other structural and optical characterizations, and thus the Raman spectroscopy was found to be useful for the characterization of the electrodeposited CdS films.