Journal of the Physical Society of Japan · 1988 · 20 citations · 7 references
Natural SciencesChemistryPhysicsAnalytical ChemistryNuclear PhysicsSpectroscopyAtomic IonizationIonization ProcessesBump BehaviorElectron Impact IonizationElectron IonizationImpact EnergyIonizationIonization Cross SectionsIonization MechanismsSub-threshold Ionization
Absolute cross sections for electron impact single ionization of O + , S + and S 2+ ions have been measured at an electron impact energy range from below threshold to 1000 eV, using the crossed beam technique. The measured cross sections for O + ions are reproduced quite well with the semiempirical Lotz formula over the whole energy range investigated. The measured cross sections for S + and S 2+ ions show a more rapid rise from the threshold to their peak than those expected from the Lotz formula. For S 2+ ions, another small bump beginning at 120 eV is observed, where no level exists that may contribute to any direct or indirect ionization processes.
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G C King, M. Tronc, F H Read et al. · Journal of Physics B Atomic and Molecular Physics · 1977 · 483 citations