Minority carrier lifetimes using compensated differental open circuit voltage decay

Measurement of diffusion length in solar cells

J. H. Reynolds, A. Meulenberg · Journal of Applied Physics · 1974 · 55 citations

Engineering, Materials Engineering, Materials Science +16

Depletion layer effects in the open-circuit- voltage-decay lifetime measurement

John E. Mahan, D.L. Barnes · Solid-State Electronics · 1981 · 54 citations

Engineering, Electrical Engineering, Materials Science +11

Effect of emitter recombinations on the open circuit voltage decay of a junction diode

S.C. Jain, R. Muralidharan · Solid-State Electronics · 1981 · 36 citations

Engineering, Electrical Engineering, Recombination +13

Determination of the bulk carrier lifetime in the low-doped region of a silicon power diode, by the method of open circuit voltage decay†

R.J. Bassett, W. EULOP, C. A. Hogarth · International Journal of Electronics · 1973 · 27 citations

Engineering, Electrical Engineering, Materials Science +17

Determination of the minority carrier lifetime in the base of a back-surface field solar cell by forward current-induced voltage decay and photovoltage decay methods

R. Muralidharan, S.C. Jain, Uma Jain · Solar Cells · 1982 · 16 citations

Engineering, Electrical Engineering, Materials Science +17