Stabilizing Dielectric Constants of Fluorine‐Doped SiO2 Films by  N 2 O  ‐Plasma Annealing

Shunsaku Takeishi, H. Kudoh, R. Shinohara, A. Tsukune, Y. Satoh, H. Miyazawa, Hideki Harada, Masao Yamada

Journal of The Electrochemical Society · 1996 · 23 citations · 0 references

Concepts

Abstract

Fluorine‐doped (FSG) has a low dielectric constant just after deposition. However, the dielectric constant of FSG gradually increases with time when left in air. We have developed a way to stabilize dielectric constants of FSG left in the air by plasma annealing. We have found that ‐plasma annealing is quite effective for blocking moisture. The dielectric constants of FSG treated by the ‐plasma annealing rarely change.