Investigation of the MOST channel conductance in weak inversion

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.3K citations

Semiconductors, Electrical Engineering, Engineering +14

Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics

Chih‐Tang Sah, Robert N. Noyce, W. Shockley · Proceedings of the IRE · 1957 · 2.1K citations

Device Modeling, Electrical Engineering, Carrier Generation +15

Electrons and holes in semiconductors

M.D. Earle · Journal of the Franklin Institute · 1951 · 1.2K citations

Semiconductors, Semiconductor Devices, Semiconductor Technology +7

<i>Electrons and Holes in Semiconductors</i>

W. Shockley, E. M. Field · Physics Today · 1952 · 1K citations

Semiconductors, Semiconductor Devices, Engineering +7

Surface states at steam-grown silicon-silicon dioxide interfaces

C. N. Berglund · IEEE Transactions on Electron Devices · 1966 · 668 citations

Electrical Engineering, Semiconductor Device, Engineering +12