Inexpensive, quantitative hydrogen depth-profiling for surface probes

A model for hydrogen isotope backscattering, trapping and depth profiles in carbon and amorphous silicon

S. Cohen, G.M. McCracken · Journal of Nuclear Materials · 1979 · 83 citations

Engineering, Materials Engineering, Materials Science +8

Ion implantation, sputtering and their applications

R.W. Cahn · Journal of Nuclear Materials · 1977 · 39 citations

Engineering, Materials Engineering, Materials Science +7

Time resolved and time integrated measurement of deuterium ion fluxes and energies in the dite tokamak, using carbon probes

S.K. Erents, E.S. Hotston, G.M. McCracken et al. · Journal of Nuclear Materials · 1980 · 26 citations

Natural Sciences, Nuclear Engineering, Physics +13

Hydrogen mobility under beam impact when using the 1H(15N, αγ) nuclear reaction for material analysis

J.P. Thomas, M. Fallavier, J. Tousset · Nuclear Instruments and Methods in Physics Research · 1981 · 23 citations

Natural Sciences, Materials Science, Physics +9

Hydrogen isotope trapping in materials exposed in PLT

W.R. Wampler, S. T. Picraux, S. Cohen et al. · Journal of Nuclear Materials · 1979 · 21 citations · Full text

Natural Sciences, Materials Science, Physics +7