B. Terreault

An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials

J. L’Ecuyer, C. Brassard, C. Cardinal et al. · Journal of Applied Physics · 1976 · 218 citations

Materials Science, Light Elements, Optical Materials +15

Profiling hydrogen in materials using ion beams

J. F. Ziegler, Chih-Wei Wu, Peter Williams et al. · Nuclear Instruments and Methods · 1978 · 203 citations

Materials Science, Engineering, Spectroscopy +4

The use of 6Li and 35Cl ion beams in surface analysis

J. L’Ecuyer, C. Brassard, C. Cardinal et al. · Nuclear Instruments and Methods · 1978 · 127 citations

Ion Implantation, Engineering, Surface Analysis +7

Hydrogen blistering of silicon: Progress in fundamental understanding

B. Terreault · physica status solidi (a) · 2007 · 118 citations

Engineering, Plasma Hydrogenation, Hydrogen Blistering +17

XPS study of the process of oxygen gettering by thin films of PACVD boron

M.M Ennaceur, B. Terreault · Journal of Nuclear Materials · 2000 · 75 citations

Materials Engineering, Materials Science, Boron Nitride +9