Solid-State Electronics · 1964 · 89 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDevice ReliabilitySemiconductor DefectsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsSemiconductor ReliabilityDegradationDevice DegradationReliability DegradationTunnel DiodesTunneling Diodes
11
Ion Drift in an <i>n-p</i> Junction
E. M. Pell · Journal of Applied Physics · 1960 · 265 citations
Rapid zinc diffusion in gallium arsenide
R. L. Longini · Solid-State Electronics · 1962 · 222 citations