Ultra‐Low Temperature Sintering and Dielectric Properties of <scp> <scp>SiO</scp> </scp> ₂ ‐Filled Glass Composites

Abstract

Ultra low temperature co‐fired ceramics system based on zinc borate 3 ZnO –2 B 2 O 3 (3Z2B) glass matrix and SiO 2 filler was investigated with regard to the phase composition, the microstructure and the dielectric properties as functions of the filler content and sintering temperature. The softening temperature of 554°C and the crystallization temperature of around 650°C for the glass were confirmed by Differential Thermal Analysis result. The X ‐ray diffraction results show that all SiO 2 ‐filled samples were made up of SiO 2 , α‐ Zn ( BO 2 ) 2 , Zn 3 B 2 O 6 phases. And there was no chemical reaction between SiO 2 and the glass during densification. And then the dielectric constant decreased with the increasing content of SiO 2 . At the level of 15 wt% SiO 2 addition, the composites can be densified at a sintering temperature of 650°C for 30 min, and showed the optimal dielectric properties at 1 MHz with the dielectric constant of 6.1 and the dielectric loss of 1.3 × 10 −3 , which demonstrates a good potential for use in LTCC technology.