International Test Conference · 1985 · 19 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceMicroelectronicsSemiconductor DevicesDefect ModelingDevice ReliabilityFault DetectionFault ModelingSemiconductor DefectsSemiconductor ReliabilityCircuit Fault AnalysisCmos ReliabilityDefect AnalysisFault AnalysisGate Oxide InterfacesGate Oxide ReliabilityOxide Defect States