Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry

Polarization in Cadmium Telluride Nuclear Radiation Detectors

P. Siffert, JA Berger, C. Scharager et al. · IEEE Transactions on Nuclear Science · 1976 · 147 citations

Surface Preparation, Engineering, Nuclear Physics +13

Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurements

H. W. Werner, A. E. Morgan · Journal of Applied Physics · 1976 · 128 citations

Engineering, Tantalum Diaphragms, Ion Mobility Spectrometry +18

Time-dependent polarization of CdTe gamma-ray detectors

R. O. Bell, G. Entine, H. B. Serreze · Nuclear Instruments and Methods · 1974 · 125 citations

Engineering, Radiation Detection, Physics +8

Theoretical and experimental aspects of secondary ion mass spectrometry

H. W. Werner · Vacuum · 1974 · 123 citations

Natural Sciences, Spectroscopy, Mass Spectrometry +8

Cadmium telluride, grown from tellurium solution, as a material for nuclear radiation detectors

R. O. Bell, N. Hemmat, F. V. Wald · physica status solidi (a) · 1970 · 92 citations

Materials Science, Cadmium Telluride, Engineering +12