Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheres

EELS log‐ratio technique for specimen‐thickness measurement in the TEM

T. Malis, Shangcong Cheng, R.F. Egerton · Journal of Electron Microscopy Technique · 1988 · 899 citations

Natural Sciences, Materials Engineering, Materials Science +11

Accurate measurements of mean inner potential of crystal wedges using digital electron holograms

M. Gajdardziska‐Josifovska, Martha McCartney, W.J. de Ruijter et al. · Ultramicroscopy · 1993 · 161 citations

Natural Sciences, Physics, Condensed Matter Physics +8

Absolute measurement of normalized thickness, t/λi, from off-axis electron holography

M.R. McCartney, M. Gajdardziska‐Josifovska · Ultramicroscopy · 1994 · 155 citations

Natural Sciences, Materials Science, Physics +10

Transmission electron holography of silicon nanospheres with surface oxide layers

Y. C. Wang, T.M. Chou, Matthew Libera et al. · Applied Physics Letters · 1997 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +17

Measurement of Polystyrene Mean Inner Potential by Transmission Electron Holography of Latex Spheres

Y.C. Wang, T.M. Chou, Matthew Libera et al. · Microscopy and Microanalysis · 1998 · 40 citations

Natural Sciences, Materials Science, Physics +16