Applied Physics Letters · 1975 · 107 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistryMaterials PhysicsThin FilmsAmorphous MaterialsDiffusion In SolidsElectrical ConductivityElectronic Material CharacterizationThin Film DiffusionAmorphous Thin FilmsDiffusion Coefficient DeterminationDiffusion In Amorphous FilmsDiffusion In Amorphous SolidsDiffusion In Oxide Thin FilmsDiffusion In OxidesDiffusion KineticsElectron Diffusion
Measurements of the electron diffusion coefficient in amorphous films of tungsten oxide give a value of D=0.0025±0.0006 cm2 sec−1. D decreases by less than a factor of 2 between +40 and −20 °C.
3