Graded etching of thermal oxide with various angles using silicafilm

Yearn-Ik Choi, Young‐Se Kwon, Choong‐Ki Kim

IEEE Electron Device Letters · 1980 · 14 citations · 4 references

Concepts

Abstract

Reproducible tapered windows in thermal oxide have been produced by depositing a silicafilm on the thermal oxide before the chemical etching. As heat treatment temperatures of silicafilms are changed from 200°C to 1,000°C, graded angles are varied approximately from 3° to 25°.

References

4