Transmission electron microscopy of Co-Cr films for magnetic recording

Abstract

The microstructure of Co-Cr thin films for perpendicular magnetic recording has been examined by transmission electron microscopy in both conventional (bright field/dark field and selected area diffraction) and convergent beam electron diffraction modes. Results of as-deposited samples indicate that the films consist of well-oriented c axis structures. A range of microstructures (columnar morphology, transition layers, twins, etc.) have been observed. These and other results will be presented.