Doubly peaked helium depth profiles in copper and blistering

An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials

J. L’Ecuyer, C. Brassard, C. Cardinal et al. · Journal of Applied Physics · 1976 · 218 citations

Materials Science, Light Elements, Optical Materials +15

Blistering of molybdenum under helium ion bombardment

S.K. Erents, G.M. McCracken · Radiation Effects · 1973 · 125 citations

Engineering, Physics, Natural Sciences +11

Implantation profiles of low-energy helium in niobium and the blistering mechanism

R. Behrisch, J. Bo ttiger, W. Eckstein et al. · Applied Physics Letters · 1975 · 114 citations

Engineering, Ion Process, Ion Implantation +16

Trapping of low-energy helium ions in niobium

R. Behrisch, J. Bøttiger, W. Eckstein et al. · Journal of Nuclear Materials · 1975 · 77 citations

Low-energy Helium Ions, Engineering, Physics +4

Helium and hydrogen re-emission during implantation of molybdenum, vanadium and stainless steel

Walter Bauer, G.J. Thomas · Journal of Nuclear Materials · 1974 · 68 citations

Materials Science, Materials Engineering, Engineering +7