Mirror electron microscope for inspecting nanometer-sized defects in magnetic media

LEEM Basics

E. Bauer · Surface Review and Letters · 1998 · 104 citations

Fundamental Physical Phenomena, Image Formation, Radiology +13

XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT

Thomas Schmidt, U. Groh, R. Fink et al. · Surface Review and Letters · 2002 · 96 citations

Engineering, Energy Efficiency, Microscopy +21

A New Low Energy Electron Microscope

R. M. Tromp, Marián Maňkoš, M. C. Reuter et al. · Surface Review and Letters · 1998 · 69 citations

Engineering, Microscopy, Electron Diffraction +16