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A time-of-flight atom-probe field-ion microscope for the study of defects in metals

Materials ScienceEngineeringElectron MicroscopyPhysicsMicroscopyNanotechnologySpectroscopyNatural SciencesCondensed Matter PhysicsApplied PhysicsScanning Force MicroscopyAtomic PhysicsMicroanalysisElectron MicroscopeScanning Probe Microscopy