Phonons in SiC from INS, IXS, and Ab-Initio Calculations

D. Strauch, B. Dörner, M. Krisch, J. Serrano, Alexey Bosak, W. J. Choyke, B. Stojetz, Michael Malorny

Materials science forum · 2006 · 10 citations · 3 references

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Abstract

Preliminary results for the phonon dispersion curves of hexagonal 4H-SiC from experimental inelastic neutron (INS) and X-ray scattering (IXS) are reported and contrasted with those of cubic 3C-SiC and silicon. The experimental frequencies and scattering intensities are in excellent agreement with those from first-principles calculations using density-functional methods. The relative merits of the two experimental techniques and aspects of the density functional perturbation theory and the so-called frozen phonon method for the determination of the basic phonon properties are briefly outlined.

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