Statistical variability in FinFET devices with intrinsic parameter fluctuations - Concepedia

Concepedia

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Statistical variability in FinFET devices with intrinsic parameter fluctuations

14

Citations

16

References

2010

Year

Chih-Hong Hwang, Yiming Li, Ming-Hung Han

Microelectronics Reliability

Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityMicroelectronicsFinfet Devices

References

	Year	Citations

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