Publication | Closed Access
Electronic transport properties of single-crystal silicon nanowires fabricated using an atomic force microscope
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Citations
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References
2002
Year
Materials ScienceNanoscale ScienceNanoscale SystemEngineeringPhysicsMicrofabricationNanomaterialsNanotechnologyNanoelectronicsApplied PhysicsAtomic Force MicroscopeElectronic Transport PropertiesNanoscale ModelingNanometrologySingle-crystal Silicon NanowiresNanomechanics
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