Admittance spectroscopy of traps at the interfaces of (100)Si with Al2O3, ZrO2, and HfO2 - Concepedia

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Admittance spectroscopy of traps at the interfaces of (100)Si with Al2O3, ZrO2, and HfO2

12

Citations

7

References

2005

Year

Linh Truong, Yanina Fedorenko, V. V. Afanas’ev, A. Stesmans

Microelectronics Reliability

Materials ScienceEngineeringPhysicsOxide ElectronicsSurface ScienceApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialSemiconductor Device FabricationAdmittance SpectroscopySilicon On InsulatorInterface Structure

References

	Year	Citations

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