Surface profiling by phase-locked interferometry

Hubert J. Matthews, D. K. Hamilton, Colin J. R. Sheppard

Applied Optics · 1986 · 39 citations · 5 references

Concepts

Abstract

A noncontacting surface profiling technique with 1-nm height resolution is described. A feedback arrangement keeps in quadrature the two arms of a confocal interference microscope by modulating the reference beam using an electrooptic phase modulator.

References

5