Electron trapping and detrapping in ion-beam-damaged diamond surfaces

Abstract

Ion-beam-damaged diamond surfaces subjected to electron irradiation are observed to develop a pronounced negative surface charge. In this study, this effect is shown to be associated with the capture of electrons into traps created by the ion irradiation process. The trapped charge increases with ion dose and incident electron current, and decreases with increasing sample temperature and laser illumination as the traps are depleted of charge. An activation energy for detrapping of about 1.5 eV is deduced from the temperature dependence of the charging.