Journal of Vacuum Science and Technology · 1981 · 75 citations · 0 references
EngineeringAtomic Emission SpectroscopyGlow DischargeCf4 Glow DischargesChemical EngineeringOptical DiagnosticsF Atom DensityEmission SpectroscopyAtomic FluorineNonthermal PlasmaIon EmissionPhysicsAtomic PhysicsCf4 DischargeNatural SciencesSpectroscopyApplied PhysicsGas Discharge PlasmaPlasma ApplicationAtomic Fluorescence Spectroscopy
The dependence of the density of atomic fluorine as a function of pressure and flow rate in CF4 glow discharges has been measured using emission spectroscopy. The emission intensity of the 7037 Å line of atomic fluorine and of the 7504 Å line of argon, which is added to the CF4 discharge in small quantities (1%–2%), is used to deduce the F atom density. It is found that the pressure dependence of the F atom emission intensity alone is a poor indicator of the relative F atom concentration because the excitation efficiency of the CF4 discharge decreases rapidly with increasing pressure. The F atom density decreases with increasing flow rate as is to be expected if the lifetime of the F atom is determined largely by the vacuum pump. However, at low flow rates the F atom density is determined primarily by contaminant gases, in this case CO and CO2, through several mechanisms which are discussed.