Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons

Philip Kahl, Simone Wall, Christian Witt, Christian Schneider, Daniela Bayer, Alexander Fischer, Pascal Melchior, M. Horn‐von Hoegen, Martin Aeschlimann, F.‐J. Meyer zu Heringdorf

Plasmonics · 2014 · 112 citations · 20 references

Concepts

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