Christian Schneider

Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons

Philip Kahl, Simone Wall, Christian Witt et al. · Plasmonics · 2014 · 109 citations

Plasmonics, Polariton Dynamic, Engineering +4

Wire-based additive manufacturing using an electron beam as heat source

Josef Fuchs, Christian Schneider, Norbert Enzinger · Welding in the World · 2018 · 86 citations · Full text

Materials Science, Materials Engineering, Engineering +14

Optical near-field interference in the excitation of a bowtie nanoantenna

Pascal Melchior, Daniela Bayer, Christian Schneider et al. · Physical Review B · 2011 · 70 citations

Photonics, Plasmonics, Local Near-field Distribution +14

Direct Observation of Surface Plasmon Polariton Propagation and Interference by Time-Resolved Imaging in Normal-Incidence Two Photon Photoemission Microscopy

Philip Kahl, Daniel Podbiel, Christian Schneider et al. · Plasmonics · 2017 · 63 citations

Photonics, Plasmonics, Polariton Dynamic +10

Residual stress state induced by high frequency mechanical impact treatment in different steel grades – Numerical and experimental study

Mansoor Khurshid, Martin Leitner, Zuheir Barsoum et al. · International Journal of Mechanical Sciences · 2017 · 49 citations

High-rate Loading, Engineering, Impact (Mechanics) +8