Publication | Closed Access
Design for reliability: the major challenge for VLSI
50
Citations
59
References
1993
Year
EngineeringComputer ArchitectureSystem ReliabilityIntegrated CircuitsHardware SecurityReliability-based DesignReliability EngineeringReliability ModelingReliabilityElectrical EngineeringHardware ReliabilityComputer EngineeringSingle Event EffectsMajor ChallengeDevice ReliabilityMicroelectronicsDesign For ReliabilityReliability IssuesReliability Management Systems DesignVlsi ArchitectureReliability ManagementElectrical Reliability IssuesCircuit Reliability
Selected integrated circuit (IC) reliability issues are discussed within the context of the design-in reliability concept. The electrical reliability issues discussed are latchup, electrostatic discharge, hot carrier effects, thin dielectric breakdown, and electromigration. Examples of the environmental reliability issues discussed are alpha -particle induced soft errors, thermal stress, mechanical stress, and corrosion.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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