High resolution magnetic patterning using Focused Ion Beam irradiation

Christophe Vieu, J. Giérak, H. Launois, T. Aign, P. Meyer, J. P. Jamet, J. Ferré, C. Chappert, V. Mathet, H. Bernas

Microelectronic Engineering · 2000 · 20 citations · 6 references

Concepts

References

6