<i>In situ</i>comprehensive characterization of optoelectronic nanomaterials for device purposes

Abstract

We have combined optical fiber probe and nanoprobe techniques in a scanning electron microscope, which enables in situ optical, electrical and structural characterization of optoelectronic nanomaterials and nanodevices. The nanoprobe technique, employing sharp metal tips, is used for in situ nano-manipulation, contact and electrical measurement. The fiber probe, coupled to a spectrometer or a laser and controlled by a nano-manipulator, allows local optical detection or excitation. We show in situ assembly of a light emitter and photodetector based on individual nanostructures, demonstrating the potential application of the above technique in building prototype optoelectronic devices and selecting suitable nanostructures for device purposes. In addition, the angular resolving power of the fiber probe detection is demonstrated to be useful for studying nanoscale waveguides.