Concepedia
C R C Critical Reviews in Solid State Sciences · 1975 · 34 citations · 4 references
4
Physics of Thin Films
G. Hass, D. Gerstenberg · Journal of The Electrochemical Society · 1964 · 1.8K citations
Natural Sciences, Materials Science, Physics +12
An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
Lewis M. Terman · Solid-State Electronics · 1962 · 1.4K citations
Engineering, Materials Engineering, Materials Science +14
Limitations of the MOS capacitance method for the determination of semiconductor surface properties
K.H. Zaininger, G. Warfield · IEEE Transactions on Electron Devices · 1965 · 132 citations
Engineering, Electrical Engineering, Materials Science +17
Measurement of carrier-concentration profiles in epitaxial indium phosphide
M.J. Cardwell, R. F. Peart · Electronics Letters · 1973 · 39 citations