IEEE Electron Device Letters · 2013 · 67 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportLight-emitting DiodesQuantum WellsSemiconductor PhysicsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsCarrier Confinement In Quantum WellsCarrier Transport In Quantum WellsGallium Nitride Light-emitting DiodesLeakage CurrentLeakage Current ReductionQuantum Well HeterostructuresQuantum Well Light-emitting DiodesQuantum Well Structures
We report the effect of V-shaped pit size, inverted hexagonal pits embedded in InGaN multiple quantum well, on the reverse leakage current of InGaN light-emitting diodes (LEDs). It was found that the reverse leakage current of InGaN LEDs with larger V-shaped pits is significantly reduced from 1.80 mA down to 3.84 nA at -30 V by several orders of magnitude. We claim that this improvement is accounted for increased Poole-Frenkel barrier height of carrier trapped at the deep centers via enlarged V-pit formation, consequently resulting in lower reverse current of InGaN LEDs.
9
Forward tunneling current in GaN-based blue light-emitting diodes
Dawei Yan, Hai Lu, Dunjun Chen et al. · Applied Physics Letters · 2010 · 89 citations
Engineering, Electrical Engineering, Materials Engineering +17