Ion beam analysis with monolayer depth resolution

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	Year	Citations
Angle resolved detection of charged particles with a novel type toroidal electrostatic analyser R.G. Smeenk, R. M. Tromp, Holger Kersten, Nuclear Instruments and Methods in Physics Research Instrument SciencePhysicsAnalytical InstrumentationInstrumentation	1982	183
Melting of al surfaces A. W. Denier van der Gon, Richard J. Smith, J.M. Gay, Surface Science Materials ScienceMaterials EngineeringAl SurfacesAluminium NitrideEngineering	1990	165
A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions Th. Enders, M. Rilli, H. D. Carstanjen Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Materials ScienceMaterials EngineeringHigh-resolution Rutherford BackscatteringSurface CharacterizationMev Ions	1992	51
Vibrational Doppler-broadening of inversep, ? reactions on1H bearing targets M. Zinke-Allmang, S. Kalbitzer, M. Weiser The European Physical Journal A PhysicsNatural SciencesSpectroscopyInverse Scattering TransformsInverse Problems	1985	37
High depth resolution ERDA of H and D by means of an electrostatic spectrometer Olaf Kruse, H. D. Carstanjen Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms High ResolutionAnalytical InstrumentationPhysicsMicroscopyNatural Sciences	1994	26

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