A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions - Concepedia

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A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions

51

Citations

7

References

1992

Year

Th. Enders, M. Rilli, H. D. Carstanjen

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials ScienceMaterials EngineeringHigh-resolution Rutherford BackscatteringSurface CharacterizationMev IonsEngineeringPhysicsMicroscopyHigh-resolution Electrostatic SpectrometerSurface AnalysisSurface ScienceApplied PhysicsIon BeamIon Emission

References

	Year	Citations

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