Room-temperature terahertz emission from nanometer field-effect transistors

N. Dyakonova, A. El Fatimy, J. Lusakowskil, W. Knap, M. I. Dyakonov, M. A. Poisson, E. Morvan, S. Bollaert, A. Shchepetov, Yannick Roelens,

Applied Physics Letters · 2006 · 135 citations · 7 references

Concepts

Abstract

Room-temperature generation of terahertz radiation in nanometer gate length InAlAs∕InGaAs and AlGaN∕GaN high-mobility transistors is reported. A well-defined source-drain voltage threshold for the emission exists, which depends on the gate bias. Spectral analysis of the emitted radiation is presented. The highest emission power emitted from a single device reached 0.1μW.

References

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