Microspot photoemission spectrometer based on FS-VUV radiation

Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy

A. Oelsner, O. Schmidt, M. Schicketanz et al. · Review of Scientific Instruments · 2001 · 140 citations

Delay Line Detector, Engineering, Microscopy +26

Resonant photoexcitation of Si(001) measured with two-photon photoemission spectroscopy

Ken‐ichi Shudo, Toshiaki Munakata · Physical review. B, Condensed matter · 2001 · 29 citations

Engineering, Silicon On Insulator, Sharp Peak +16

Time-resolved photoemission microspectroscopy based on fs-VUV laser light

Toshiaki Munakata, Takuya Masuda, Nobuo Ueno et al. · Surface Science · 2002 · 27 citations

Photonics, Engineering, Time-resolved Photoemission Microspectroscopy +2

PEEM and MEEM of chloroaluminum phthalocyanine ultrathin film on MoS2

Hideyuki Yasufuku, M. Okumura, Satoshi Kera et al. · Journal of Electron Spectroscopy and Related Phenomena · 2001 · 21 citations

Ii-vi Semiconductor, Inorganic Chemistry, Transition Metal Chalcogenides +7

Nanospectroscopy at Elettra

Stefan Heun, Thomas Schmidt, B. Ressel et al. · Synchrotron Radiation News · 1999 · 12 citations

Engineering, Nanomaterials, Nanotechnology +4