Microdomain Morphology Analysis of Block Copolymers by Atomic Force Microscopy with Phase Detection Imaging

Abstract

We use atomic force microscopy (AFM) with phase detection imaging (PDI) in order to study the surface microdomain morphology of thick (i.e., ca. 2 mm) films of triblock copolymers. We present here the results obtained on a poly(methyl methacrylate)-block-polybutadiene-block-poly(methyl methacrylate) (PMMA-b-PBD-b-PMMA) copolymer prepared by using a 1,3-diisopropenylbenzene (DIB)-based difunctional anionic initiator. Our data illustrate the interest of PDI for the elucidation of surface phase separation in block copolymers. We show that the surface of thick films studied by this new technique exhibits a two-phase structure corresponding to the two types of components.