Publication | Closed Access
Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope
28
Citations
4
References
1993
Year
EngineeringCoherent Gradient SensingMeasurementCalibrationOptical TestingOptical ConfigurationRectangular PlateInterferometrySlope ChangeEducationComputational ImagingSimultaneous MeasurementInstrumentationOut-of-plane DisplacementOptical System AnalysisDigital Holography
An optical configuration is presented for simultaneous measurement of out-of-plane displacement and slope change in electronic speckle pattern interferometry. Experimental results for a rectangular plate clamped along the edges and loaded at the center are presented.
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