Applied Physics Letters · 2004 · 62 citations · 9 references
EngineeringMaterials EngineeringMaterials ScienceNanomaterialsNanotechnologySemiconductor MaterialsIii-v SemiconductorsNanomaterial CharacterizationNanoscale MaterialsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor NanomaterialsGallium Nitride (Gan) MaterialsHigh-resolution Electron MicroscopyHigh-resolution Transmission Electron MicroscopyMetalorganic Vapor Phase EpitaxyNanorodsSemiconductor NanorodsSynchrotron DiffractionSynchrotron X-ray Diffraction
We report on heteroepitaxial fabrication and structural characterizations of ultrafine GaN/ZnO coaxial nanorod heterostructures. The coaxial nanorod heterostructures were fabricated by epitaxial growth of a GaN layer on ultrafine ZnO nanorods. Epitaxial growth and precise control of GaN overlayer thickness were obtained by low pressure metalorganic vapor-phase epitaxy. ZnO nanorods grown on Si and sapphire substrates using catalyst-free metalorganic chemical vapor deposition exhibited diameters as small as 7 nm. Furthermore, structural properties of the coaxial nanorod heterostructures were investigated using both synchrotron-radiation x-ray diffraction and high resolution transmission electron microscopy.
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