Determination of surface properties by means of large signal photovoltage pulses and the influence of trapping

Semiconductor Surfaces

P. J. Boddy · Surface Science · 1966 · 800 citations

Physical Theory of Semiconductor Surfaces

C. G. B. Garrett, W. H. Brattain · Physical Review · 1955 · 555 citations

Semiconductors, Surface Characterization, Electrical Engineering +15

Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements

R. Castagné, A. Vapaille · Surface Science · 1971 · 521 citations

DENSITY OF SiO2–Si INTERFACE STATES

Peter V. Gray, D.M. Brown · Applied Physics Letters · 1966 · 405 citations · Full text

Semiconductor Material, Applied Physics

Surface Properties of II-VI Compounds

Robert K. Swank · Physical Review · 1967 · 390 citations

Engineering, Electron Affinity, Optoelectronic Devices +21