Physical Review Letters · 1983 · 158 citations · 11 references
EngineeringMicroscopyVacuum-tunneling Microscopy ExperimentsVacuum DeviceTunneling MicroscopyElectron MicroscopyMicroscopy MethodNanoelectronicsElectrical EngineeringPhysicsNanotechnologyModel TheoryMicroelectronicsSurface CharacterizationExperimental ResultsScanning Probe MicroscopySurface ScienceCondensed Matter PhysicsApplied PhysicsScanning Force MicroscopySurface AnalysisTip Shapes
A theory is presented for the scanning vacuum-tunneling microscopy experiments performed by Binning et al. The tunnel current is obtained for different geometries and tip shapes. Lateral resolutions are 4-8 \AA{} for distances from the tip to the sample \ensuremath{\sim}3.5-4.5 \AA{}, effective tip radii \ensuremath{\sim}3-10 \AA{}, 1-nA currents, and applied voltage \ensuremath{\sim}0.01 eV. The Au(110)(1\ifmmode\times\else\texttimes\fi{}2) surface is analyzed and the experimental results discussed.
11
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