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Epitaxial growth and demonstration of hexagonal BN/AlGaN p-n junctions for deep ultraviolet photonics
113
Citations
17
References
2012
Year
Oxide HeterostructuresPhotonicsMaterials ScienceSemiconductorsEngineeringAluminium NitridePhysicsCrystalline DefectsHexagonal Boron NitrideBoron NitrideApplied PhysicsAluminum Gallium NitrideMolecular Beam EpitaxyEpitaxial GrowthOptoelectronicsRecent AdvancesNanophotonicsDeep Ultraviolet Photonics
Recent advances in epitaxial growth and demonstration of p-type conductivity in hexagonal boron nitride (hBN) epilayers represent an exceptional opportunity to revolutionize p-layer approach and overcome the intrinsic problem of low p-type conductivity in Al-rich AlGaN for deep ultraviolet (DUV) device applications. Nevertheless, the ability of epitaxial growth of hBN on AlGaN is a prerequisite for the incorporation of p-type hBN in AlGaN DUV device structures. We report on the epi-growth of hBN on Al-rich AlGaN/AlN/Al2O3 templates using metal organic chemical vapor deposition. X-ray diffraction measurement revealed a 2θ peak at 26.5° which indicates that the BN epilayers are hexagonal and consist of a single phase. Mg doped hBN epilayers were also grown on highly insulating AlN and n-type AlGaN templates with an attempt to demonstrate hBN/AlGaN p-n junctions. Mg doped hBN epilayers grown on insulating templates were p-type with an in-plane resistivity of ∼2.3 Ω cm. Diode behavior in the p-n structures of p-hBN/n-AlxGa1−xN (x ∼ 0.62) has been demonstrated. The results here reveal the feasibility of using highly conductive p-type hBN as an electron blocking and p-contact layers for AlGaN deep UV emitters.
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