An In-Situ Synchrotron X-ray Diffraction Tomography Study of Crystallization and Preferred Crystal Orientation in a Stirred Reactor

Simon D. M. Jacques, K. Pile, P. Barnes, X. Lai, Kevin J. Roberts, R.A. Williams

Crystal Growth & Design · 2005 · 25 citations · 7 references

Abstract

A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to crystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.

References

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