Simon D. M. Jacques

Implementation of a combined SAXS/WAXS/QEXAFS set-up for time-resolved<i>in situ</i>experiments

Sergey I. Nikitenko, Andrew M. Beale, Ad M. J. van der Eerden et al. · Journal of Synchrotron Radiation · 2008 · 257 citations · Full text

X-ray Crystallography, Zeotype Crystallization Processes, Engineering +20

Pair distribution function computed tomography

Simon D. M. Jacques, Marco Di Michiel, Simon A. J. Kimber et al. · Nature Communications · 2013 · 113 citations · Full text

Computed Tomography, Engineering, Reconstruction Technique +7

Understanding the residual stress distribution through the thickness of atmosphere plasma sprayed (APS) thermal barrier coatings (TBCs) by high energy synchrotron XRD; digital image correlation (DIC) and image based modelling

Chun Li, Xun Zhang, Ying Chen et al. · Acta Materialia · 2017 · 113 citations · Full text

Pixellated Cd(Zn)Te high-energy X-ray instrument

P. Seller, S. Bell, Robert J. Cernik et al. · Journal of Instrumentation · 2011 · 111 citations

X-ray Spectroscopy, Engineering, Microscopy +21

A Combined SAXS/WAXS/XAFS Setup Capable of Observing Concurrent Changes Across the Nano-to-Micrometer Size Range in Inorganic Solid Crystallization Processes

Andrew M. Beale, Ad M. J. van der Eerden, Simon D. M. Jacques et al. · Journal of the American Chemical Society · 2006 · 110 citations

Engineering, Crystal Growth Technology, Chemistry +18